Values reported are measures of noise obtained though the 'many pixel' method used at UofR. A set of 200 all-destructive reads is obtained at each bias, with consecutive scans differenced and analyzed to yield an areal standard deviation. This sdev is divided by root-2 and reported as read noise here.
FWIW, the plot below shows a not-terrible exponential fit to the data. The blackbody was switched off during this measurement, but there is probably some low-level light leak in the test dewar so it may be worth spot-checking this data when the device is taped off for a dark current measurement.
Bias values are relative to VDDUC/VRST setting of -2.221V. VDET values are more negative than VDDUC/VRST, but biases are plotted as magnitude.
Relevant log pages: EXES Vol.3, pp.94 - 95
Data collected at T = 7K, with a three second scan time. Values are in raw DN (1DN ~ 35 electrons)
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